Title :
Uncertainty specification for Data Acquisition Devices (DAQ)
Author :
Braudaway, David W.
Abstract :
Specification of uncertainties has historically been done by a variety of methods with differences in the results, especially for instruments and standards that achieve small values of uncertainty. This problem has been addressed in the new Draft being considered for IEC Standard on Data Acquisition Devices (DAQ) by use of coverage factor rather than other popular methods of specifying uncertainty. The source and history of statistics/uncertainty are reviewed; popular current techniques for specifying uncertainty are compared. The components of uncertainty specified for DAQ are reviewed and their effects discussed.
Keywords :
data acquisition; statistics; uncertain systems; coverage factor; data acquisition device; expanded uncertainty; uncertainty specification; Calibration; Costs; Data acquisition; IEC standards; Instruments; Laboratories; Manufacturing; Measurement standards; Measurement uncertainty; Time measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1207892
