• DocumentCode
    1577210
  • Title

    Effects of N2 addition on aluminum alloy etching: optical emission spectroscopy studies

  • Author

    Kim, Kil Ho ; Shin, Kang Sup ; Baek, Kye Hyun ; Park, Chang Wook ; Lee, Won Gyu

  • Author_Institution
    Process Dev. Dept., Hyundai Electron. Ind. Co., Kyoungki, South Korea
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    448
  • Lastpage
    451
  • Abstract
    Effects of N2 addition on the plasma composition activated with `Cl2+BCl3´ and on the aluminum alloy etching in an inductively coupled plasma source are studied. Optical emission spectroscopy data reveal that admiring small amount of N2 to the `Cl2+BCl3´-plasma generally expedites dissociation processes to increase the density of Cl species within it. The N2 addition also accelerates the formation of passivation polymers via carbon species, which adhere to the sidewalls of patterned metal lines and protect them against the lateral attacks of deflected diffusive etchants such as Cl species. It seems that the relative abundance of Cl species over the passivation polymers, both which are controlled by the N2 addition, is a critical factor in determining the sidewall features of patterned metal lines
  • Keywords
    aluminium alloys; metallisation; sputter etching; N2 addition; aluminum alloy; dissociation; inductively coupled plasma etching; optical emission spectroscopy; passivation polymer; patterned metal line sidewall; Acceleration; Aluminum alloys; Etching; Passivation; Plasma applications; Plasma sources; Polymers; Protection; Spectroscopy; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI and CAD, 1999. ICVC '99. 6th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-5727-2
  • Type

    conf

  • DOI
    10.1109/ICVC.1999.820961
  • Filename
    820961