• DocumentCode
    1577351
  • Title

    A novel PC-add on system for the measurement of amplitude spectra of quartz and ceramic resonators

  • Author

    Deshmukh, K.P. ; Sontakke, T.R.

  • Author_Institution
    Dept. of Electron., SGGS Coll. of Eng. & Technol., India
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1036
  • Abstract
    A simple, cost-effective, computer-controlled measurement system designed and developed for the characterization of the electrical properties of piezoelectric crystal and ceramic resonators is presented. A resonator, as a passive element, is connected in a standard transmission-π network. The peak amplitude at the output of the π-network is scanned at successive frequencies controlled by an algorithm that uses small frequency steps to find the resonances and other coupled modes of the resonator. The evaluation of the data to determine few of the equivalent electric circuit parameters of a resonator is done using the standard equations. The amplitude-frequency plots (amplitude spectrums) of various resonators, obtained on the developed system, are presented in the paper. The results are found to be in close conformity with the manufacturer´s data for the resonator. The measurement system presented could be used to understand the general behavior of any resonator in the frequency domain. The system is found to be stable over a frequency range from 50 Hz to 32 MHz.
  • Keywords
    add-on boards; crystal resonators; measurement systems; piezoceramics; quartz; spectral analysis; 0.05 to 32 MHz; PC add-on system; amplitude spectra measurement; amplitude-frequency plot; ceramic resonators; frequency domain; peak amplitude; piezoelectric crystal resonator; quartz resonator; transmission-π network; Ceramics; Circuits; Educational institutions; Electric variables measurement; Frequency measurement; Pulse measurements; Rectifiers; Semiconductor device measurement; Voltage; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1207910
  • Filename
    1207910