DocumentCode :
1577569
Title :
Numerical analysis of a coaxial line terminated with a complex gap capacitance
Author :
Obrzut, J. ; Anopchenko, A.
Author_Institution :
National Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
2
fYear :
2003
Firstpage :
1074
Abstract :
A full wave numerical analysis was performed for a coaxial line terminated by a complex gap capacitance. The scattering parameters, input impedance and the spatial distribution of the electromagnetic field have been obtained in the frequency range of 100 MHz to 20 GHz for specimens 8 μm to 320 μm thick, with a dielectric constant of up to 70. It was found that the impedance characteristic of the network is affected by the LC resonance coupled with the cavity resonance. Embedding in the network an inductive component, such as section of the coaxial transmission line, allows one to decouple these two resonant behaviors. The specimen inductance is linearly dependent on the specimen thickness. At frequencies near the cavity resonance, the specimen section can be treated as a network of a transmission line with capacitance, where the fundamental mode propagates along the diameter of the specimen. The results are useful in improving accuracy of broadband dielectric measurements in extended frequency range of thin films with high dielectric constant that are of interest to bio- and nano-technology.
Keywords :
capacitance measurement; coaxial cables; numerical analysis; 100 to 20E3 MHz; 8 to 320 microns; LC resonance; broadband dielectric measurement; cavity resonance; coaxial line; complex gap capacitance; dielectric constant; electromagnetic field; input impedance; numerical analysis; scattering parameters; spatial distribution; thin film; Capacitance; Coaxial components; Couplings; Dielectric constant; Electromagnetic fields; Frequency; Impedance; Numerical analysis; Resonance; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-7705-2
Type :
conf
DOI :
10.1109/IMTC.2003.1207918
Filename :
1207918
Link To Document :
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