Title :
On Failure Rate Assessment Using an Executable Model of the System
Author :
Neishaburi, Mohammad Hossein ; Zilic, Zeljko
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
Statistical data from many application fields confirm that SoC products implemented in modern deep submicron technologies are getting more and more susceptible to transient errors. Although thorough and comprehensive understanding of the services that SoCs provide is the key to systematic development, designers no longer can ignore the emerging reliability issues. In fact, proper actions should be carried out at various stage of production to mitigate the effect of transient errors. Having failure rate of a system at early stage of SoC development will help companies and designers to make right decisions at right time concerning the usage of error protection mechanisms with suitable intensity across different modules. This paper proposes a new method to estimate failure rate of modules inside a SoC.
Keywords :
fault diagnosis; logic design; logic testing; statistical analysis; system-on-chip; SoC; deep submicron technology; error protection mechanism; executable model; failure rate assessment; statistical data; transient error; Computational modeling; Connectors; Error analysis; Hardware; Software; System-on-a-chip; Unified modeling language; Failure Modes and Effects Analysis; UML-RT;
Conference_Titel :
Digital System Design (DSD), 2011 14th Euromicro Conference on
Conference_Location :
Oulu
Print_ISBN :
978-1-4577-1048-3