• DocumentCode
    1577817
  • Title

    Calculation of the impedance of a rectangular waveguide aperture in the presence of a loaded dipole antenna embedded in a generally lossy material

  • Author

    Hughes, Dana ; Zoughi, Reza

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1126
  • Abstract
    The use of a combined embedded modulated scattering technique, utilizing a PIN diode-loaded dipole probe, and near-field microwave nondestructive testing technique, utilizing an open-ended rectangular waveguide, has been investigated as a means for determining the complex dielectric constant in which the MST probe is embedded. For this, the formulation of the forward problem of calculating the modulated reflection coefficient, measured at the aperture of the waveguide, is presented here. This formulation is based upon the reciprocity theorem for two antennae, and utilizes the near-field radiation pattern of a rectangular waveguide aperture and current distribution along the length of a dipole antenna. This formulation is verified with measured values as a function of location, load impedance and surrounding media. Finally, potential improvements, considerations, and the use of an inversion routine are discussed.
  • Keywords
    dielectric measurement; dipole antennas; nondestructive testing; p-i-n diodes; rectangular waveguides; PIN diode-loaded dipole probe; current distribution; dielecric constant; impedance calculation; loaded dipole antenna; lossy material; microwave nondestructive testing; modulated scattering technique; near-field radiation pattern; reciprocity theorem; rectangular waveguide aperture; reflection coefficient; Antenna measurements; Antenna theory; Aperture antennas; Dielectric materials; Dipole antennas; Impedance; Loaded antennas; Probes; Rectangular waveguides; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1207929
  • Filename
    1207929