DocumentCode
1578172
Title
The measurement study of radiated emission for chip microcomputer development system
Author
Changlin, Zhou ; Xuebing, Qin ; Zhongyi, Zbu ; Qingmei, Chang
Author_Institution
Zheng Zhou Inst. of Electron. Technol., China
fYear
1997
Firstpage
387
Lastpage
388
Abstract
This paper presents the principle and method of chip microcomputer radiated emission using a TEM cell. It gives the calculation formulas of equivalent radiated power in free space. It also gives the emission measurement result for the MCS-51 chip microcomputer development system in the frequency band 0.15 MHz-30 MHz and gives further explanations
Keywords
computer testing; electromagnetic compatibility; microcomputers; radiofrequency interference; 0.15 to 30 MHz; MCS-51 chip microcomputer development system; TEM cell; equivalent radiated power; free space; measurement study; radiated emission; Microcomputers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location
Beijing
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ELMAGC.1997.617169
Filename
617169
Link To Document