Title :
A
-Band On-Wafer Active Load–Pull System Based on Down-Conversion Techniques
Author :
Teppati, Valeria ; Benedickter, Hansruedi ; Marti, Diego ; Garelli, Marco ; Tirelli, Stefano ; Lovblom, Rickard ; Fluckiger, Ralf ; Alexandrova, Maria ; Ostinelli, Olivier ; Bolognesi, C.R.
Author_Institution :
Millimeter-Wave Electron. (MWE) Group, ETH Zurich, Zürich, Switzerland
Abstract :
A new W-band active load-pull system is presented. It is the first load-pull system to implement a 94 GHz load by means of an active loop exploiting frequency conversion techniques. The active loop configuration demonstrates a number of advantages that overcome the typical limitations of W-band passive tuners or conventional active open-loop techniques in a cost-effective way: load reflection coefficients ΓL as high as 0.95 in magnitude can be achieved at 94 GHz, thus providing a nearly full coverage of the Smith chart. Possible applications of the setup include technology assessment, large-signal device model verification at sub-terahertz frequencies, and W-band monolithic microwave integrated circuit design and characterization. The availability of direct and accurate load-pull measurements at W-band should prove an asset in the development of sub-terahertz integrated circuits. First measurements performed on high-performance InP double heterojunction bipolar transistors and GaN high electron-mobility transistors are presented.
Keywords :
III-V semiconductors; MMIC frequency convertors; active networks; gallium compounds; heterojunction bipolar transistors; high electron mobility transistors; indium compounds; integrated circuit design; wide band gap semiconductors; GaN; HEMT; InP; MMIC characterization; Smith chart; W-band on-wafer active load-pull system; active open-loop techniques; double heterojunction bipolar transistors; down-conversion techniques; frequency 94 GHz; frequency conversion techniques; high electron-mobility transistors; large-signal device model verification; load-pull measurements; monolithic microwave integrated circuit design; passive tuners; sub-terahertz integrated circuits; technology assessment; Accuracy; Calibration; HEMTs; Millimeter wave measurements; Real-time systems; Transmission line measurements; Uncertainty; Active devices; active-device measurements; load–pull; nonlinear measurements; transistor measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2013.2292042