• DocumentCode
    157850
  • Title

    Mosaic: Exploiting the spatial locality of process variation to reduce refresh energy in on-chip eDRAM modules

  • Author

    Agrawal, Ankit ; Ansari, A. ; Torrellas, Josep

  • Author_Institution
    Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2014
  • fDate
    15-19 Feb. 2014
  • Firstpage
    84
  • Lastpage
    95
  • Abstract
    EDRAM cells require periodic refresh, which ends up consuming substantial energy for large last-level caches. In practice, it is well known that different eDRAM cells can exhibit very different charge-retention properties. Unfortunately, current systems pessimistically assume worst-case retention times, and end up refreshing all the cells at a conservatively-high rate. In this paper, we propose an alternative approach. We use known facts about the factors that determine the retention properties of cells to build a new model of eDRAM retention times. The model is called Mosaic. The model shows that the retention times of cells in large eDRAM modules exhibit spatial correlation. Therefore, we logically divide the eDRAM module into regions or tiles, profile the retention properties of each tile, and program their refresh requirements in small counters in the cache controller. With this architecture, also called Mosaic, we refresh each tile at a different rate. The result is a 20x reduction in the number of refreshes in large eDRAM modules - practically eliminating refresh as a source of energy consumption.
  • Keywords
    DRAM chips; cache storage; energy conservation; power aware computing; Mosaic; cache controller; charge-retention properties; eDRAM cells; eDRAM retention times; embedded DRAM; energy consumption; on-chip eDRAM modules; process variation spatial locality; refresh energy reduction; refresh requirements; spatial correlation; Abstracts; Capacitors; Irrigation; Random access memory; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computer Architecture (HPCA), 2014 IEEE 20th International Symposium on
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/HPCA.2014.6835978
  • Filename
    6835978