Title :
Dual tone analysis for phase-plane coverage in ADC metrological characterization
Author :
Monteiro, Conceição Líbano ; Arpaia, Pasquale ; Serra, António Cruz
Author_Institution :
Telecommun. Inst., Tech. Univ. of Lisbon, Lisboa, Portugal
Abstract :
An analytical description of the phase plane behavior of an amplitude-balanced dual-tone signal for nonlinear analog-to-digital converters testing is presented. A new figure of merit for the phase plane coverage quality of the dual-tone test signal is proposed and evaluated, and finally, conditions for optimal input frequency selection are analytically derived for practical calibration applications.
Keywords :
analogue-digital conversion; calibration; integrated circuit testing; ADC metrological characterization; amplitude-balanced dual-tone signal; analog-to-digital converter; dual tone analysis; figure of merit; input frequency selection; nonlinear ADC testing; phase plane coverage; Calibration; Frequency; Niobium; Sampling methods; Signal analysis; Signal mapping; Signal processing; Testing; Uniform resource locators; World Wide Web;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1207968
