DocumentCode :
1578844
Title :
Invariant texture analysis based on attributes of texture elements
Author :
Kishor, Goyal Roop ; Mital, D.P. ; Goh, W.L.
Author_Institution :
Dept. of Electr. & Commun. Eng., Singapore Polytech., Singapore
Volume :
1
fYear :
34881
Firstpage :
400
Abstract :
A texture can be characterised by the histograms of its texture element´s (texel) attributes. With affine transformations, some texel attributes change but the histogram of all attributes undergoes changes. In this paper, a method to convert the attribute histogram into an invariant histogram is proposed. The invariant histogram shows a higher correlation between the images of same texture than that of with images of different textures. This histogram is useful in characterising textures invariant of scaling and rotation. Experimental results of texture characterisation and recognition using invariant intensity (average texel intensity) histogram are presented
Keywords :
image recognition; image texture; affine transformations; attribute histogram; average texture element intensity; different texture images; invariant histogram; invariant intensity; invariant texture analysis; same texture images; texture characterisation; texture elements histograms; texture recognition; Character recognition; Energy resolution; Entropy; Histograms; IEEE catalog; Image analysis; Image converters; Image segmentation; Image texture analysis; Strontium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 1995. ISIE '95., Proceedings of the IEEE International Symposium on
Conference_Location :
Athens
Print_ISBN :
0-7803-7369-3
Type :
conf
DOI :
10.1109/ISIE.1995.497030
Filename :
497030
Link To Document :
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