DocumentCode
1578997
Title
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC
Author
Pouget, V. ; Lewis, D. ; Fouillat, P.
Author_Institution
Univ. Bordeaux, Talence, France
Volume
2
fYear
2003
Firstpage
1376
Abstract
This paper presents an experimental system for integrated circuits testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8 bit half-flash ADC.
Keywords
analogue-digital conversion; integrated circuit testing; laser beam effects; 8 bit; ADC; analog-to-digital converter; default localization; integrated circuits testing; pulsed laser beam; radiation sensitivity evaluation; signal propagation; spatial resolution; temporal resolution; time-resolved scanning; transient fault injection; Application specific integrated circuits; Circuit faults; Integrated circuit testing; Laser applications; Laser beams; Optical pulses; Pulse circuits; Signal resolution; Spatial resolution; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1207976
Filename
1207976
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