Title :
Automated Design Debugging in a Testbench-Based Verification Environment
Author :
Dehbashi, Mehdi ; Sülflow, André ; Fey, Görschwin
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
Abstract :
Debugging is one of the major bottlenecks in the current VLSI design process as design size and complexity increase. Efficient automation of debugging procedures helps to reduce debugging time and to increase diagnosis accuracy. This work proposes an approach for automating the design debugging procedures by integrating SAT-based debugging with test bench based verification. The diagnosis accuracy increases by iterating debugging and counterexample generation, i.e., the total number of fault candidates decreases. The experimental results show that our approach is as accurate as exact formal debugging in 71% of the experiments.
Keywords :
VLSI; circuit complexity; computability; electronic design automation; formal verification; integrated circuit design; SAT-based debugging; VLSI design; automated design debugging; counterexample generation; debugging time reduction; design complexity; design size; formal debugging; testbench-based verification environment; Accuracy; Algorithm design and analysis; Circuit faults; Debugging; Logic gates; Memory management; Sequential circuits; automated debugging; diagnostic trace; testbench;
Conference_Titel :
Digital System Design (DSD), 2011 14th Euromicro Conference on
Conference_Location :
Oulu
Print_ISBN :
978-1-4577-1048-3
DOI :
10.1109/DSD.2011.67