Title :
Pre-silicon Characterization of NIST SHA-3 Final Round Candidates
Author :
Guo, Xu ; Srivastav, Meeta ; Huang, Sinan ; Ganta, Dinesh ; Henry, Michael B. ; Nazhandali, Leyla ; Schaumont, Patrick
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
Abstract :
The NIST SHA-3 competition aims to select a new secure hash standard. Hardware implementation quality is an important factor in evaluating the SHA-3 finalists. However, a comprehensive methodology to benchmark five final round SHA-3 candidates in ASIC is challenging. Many factors need to be considered, including application scenarios, target technologies and optimization goals. This work describes detailed steps in the silicon implementation of a SHA-3 ASIC. The plan of ASIC prototyping with all the SHA-3 finalists, as an integral part of our SHA-3 ASIC evaluation project, is motivated by our previously proposed methodology, which defines a consistent and systematic approach to move a SHA-3 hardware benchmark process from FPGA prototyping to ASIC implementation. We have designed the remaining five SHA-3 candidates in 0.13 μm IBM process using standard-cell CMOS technology. In this paper, we discuss our proposed methodology for SHA-3 ASIC evaluation and report the latest results based on post-layout simulation of the five SHA-3 finalists with Round 3 tweaks.
Keywords :
CMOS integrated circuits; application specific integrated circuits; cryptography; field programmable gate arrays; performance evaluation; ASIC; FPGA prototyping; IBM process; NIST SHA-3 competition; hash standard; pre-silicon characterization; size 0.13 mum; standard-cell CMOS technology; Application specific integrated circuits; Benchmark testing; Computer architecture; Field programmable gate arrays; Hardware; Measurement; Throughput; ASIC; Hardware Evaluation; Methodology; SHA-3;
Conference_Titel :
Digital System Design (DSD), 2011 14th Euromicro Conference on
Conference_Location :
Oulu
Print_ISBN :
978-1-4577-1048-3
DOI :
10.1109/DSD.2011.74