• DocumentCode
    1579609
  • Title

    Light trapping efficiency in thin-film silicon photovoltaic cells with a photonic pattern

  • Author

    Andreani, L.C. ; Zanotto, S. ; Liscidini, M.

  • Author_Institution
    Dept. of Phys. A. Volta, Univ. of Pavia, Pavia, Italy
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We present a theoretical study of amorphous and crystalline thin-film solar cells with a periodic pattern on a sub-micron scale realized in the silicon layer and filled with silicon dioxide right below a properly designed antireflection coating. The study and optimization of the PV structure as a function of all the photonic crystals parameters allows to identify the different roles of the periodic pattern and of the etching depth in determining an increase of the absorption. By patterning thin-film silicon solar cells with a periodic etching in addition to an antireflection coating, we found an increase of the short-circuit current up to 36.5% for crystalline silicon. These results demonstrate the advantage of a wavelength-scale, photonic-crystal based approach.
  • Keywords
    amorphous semiconductors; antireflection coatings; elemental semiconductors; etching; photonic crystals; short-circuit currents; silicon; silicon compounds; solar cells; thin films; PV structure optimisation; Si; SiO2; amorphous thin-film solar cells; antireflection coating; crystalline thin-film solar cells; etching depth; light trapping efficiency; patterning thin-film silicon solar cells; photonic crystal parameters; photonic pattern; short-circuit current; thin-film silicon photovoltaic cells; wavelength-scale based approach; Absorption; Amorphous materials; Coatings; Crystallization; Etching; Periodic structures; Photonic crystals; Photovoltaic cells; Semiconductor thin films; Silicon compounds; diffraction grating; photonic crystals; photovoltaic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks (ICTON), 2010 12th International Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-7799-9
  • Electronic_ISBN
    978-1-4244-7797-5
  • Type

    conf

  • DOI
    10.1109/ICTON.2010.5549033
  • Filename
    5549033