DocumentCode
1579702
Title
HDL-Mutation Based Simulation Data Generation by Propagation Guided Search
Author
Xie, Tao ; Mueller, Wolfgang ; Letombe, Florian
Author_Institution
C-Lab., Univ. of Paderborn, Paderborn, Germany
fYear
2011
Firstpage
608
Lastpage
615
Abstract
HDL-mutation based fault injection and analysis is considered as an important coverage metric for measuring the quality of design simulation processes [20, 3, 1, 2]. In this work, we try to solve the problem of automatic simulation data generation targeting HDL mutation faults. We follow a search based approach and eliminate the need for symbolic execution and mathematical constraint solving from existing work. An objective cost function is defined on the test input space and serves the guidance of search for fault-detecting test data. This is done by first mapping the simulation traces under a test onto a control and data flow graph structure which is extracted from the design. Then the progress of fault detection can be measured quantitatively on this graph to be the cost value. By minimizing this cost we approach the target test data. The effectiveness of the cost function is investigated under an example neighborhood search scheme. Case study with a floating point arithmetic IP design has shown that the cost function is able to guide effectively the search procedure towards a fault-detecting test. The cost calculation time as the search overhead was also observed to be minor compared to the actual design simulation time.
Keywords
data flow graphs; floating point arithmetic; hardware description languages; logic design; HDL mutation faults; HDL-mutation based fault injection; HDL-mutation based simulation data generation; automatic simulation data generation; data flow graph structure; design simulation processes; fault-detecting test data; floating point arithmetic IP design; mathematical constraint solving; neighborhood search scheme; propagation guided search; symbolic execution; Analytical models; Computational modeling; Cost function; Data models; Fault detection; Hardware design languages; Testing; fault-based simulation; mutation testing; search-based test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design (DSD), 2011 14th Euromicro Conference on
Conference_Location
Oulu
Print_ISBN
978-1-4577-1048-3
Type
conf
DOI
10.1109/DSD.2011.83
Filename
6037467
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