Title :
A Programmable Discharge Circuitry With Current Limiting Capability for a Retinal Prosthesis
Author :
Sivaprakasam, Mohanasankar ; Liu, Wentai ; Wang, Guoxing ; Weiland, James D. ; Humayun, Mark S.
Author_Institution :
Dept. of Electr. Eng., California Univ., Santa Cruz, CA
Abstract :
Biphasic stimulation is the most commonly used electrical pattern in FES (Functional Electrical Stimulation). In such cases, a charge balanced waveform is essential to prevent any charge accumulation in the biological tissue. In a retinal prosthesis, a charge cancellation circuitry is used to discharge the stimulation sites on the retina periodically to ensure tissue safety. But discharging a node that has high voltage (due to charge accumulation) will induce large currents that might lead to unintended stimulation of the retina. This paper presents a new discharge circuitry which can act as a simple resistive discharge path for smaller voltages and a current limiter for higher voltages. In stimulation circuits which use a dual voltage scheme (positive and negative), the circuit limits the current at both polarities. The discharge profile is programmable digitally. In addition, a method to characterize inter-pixel leakage in a retinal prosthesis using this circuit is proposed
Keywords :
bioelectric phenomena; biological tissues; biomedical electronics; eye; prosthetics; biological tissue; biphasic stimulation; charge accumulation; charge balanced waveform; charge cancellation circuitry; current limiter; current limiting capability; discharge circuitry; dual voltage scheme; electrical pattern; functional electrical stimulation; interpixel leakage; programmable discharge circuitry; resistive discharge path; retina; retinal prosthesis; tissue safety; Coils; Current limiters; Driver circuits; Electrodes; Implants; Mirrors; Prosthetics; Retina; Telemetry; Voltage;
Conference_Titel :
Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8741-4
DOI :
10.1109/IEMBS.2005.1615659