DocumentCode :
1580437
Title :
Manufacturing implementation of low-k dielectrics for copper damascene technology
Author :
Ruelke, H. ; Streck, C. ; Hohage, J.
Author_Institution :
Adv. Micro Devices, AMD Saxony Manuf. GmBH, Dresden
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
356
Lastpage :
361
Abstract :
Advanced logic devices are setting new demands for backend integration. New high-end processor families like the AMD AthlonTM and AMD\´s eighth generation processor (codenamed "Hammer"), require the introduction of low-k interlayer dielectric (ILD) materials with copper to enable improvements in chip speed and reduction of overall power consumption. This is a challenging process for both tool suppliers and integrated circuit manufacturers. The semiconductor industry is looking for a low-k solution that delivers easy-to-integrate, high-performance dielectric films combined with high throughput and low cost of ownership. Based on key technical and manufacturing requirements, Advanced Micro Devices, Inc. has chosen the Applied Materials Producer system for low-k dielectric process applications. Implementation of Black DiamondTM (BD) and BLOkTM into the process flow enables an integrated k value of <3.0, which represents a 20 percent reduction compared to fluorinated silicate glass (F-TEOS) and silicon nitride (SiN). At Fab 30, AMD\´s advanced copper manufacturing line, the Producer has demonstrated reliable and stable performance in high volume production for the deposition of conventional dielectric films. This paper focuses on bringing a low-k dielectric solution beyond F-TEOS to full manufacturing readiness for copper interconnect technology.
Keywords :
copper; dielectric thin films; integrated circuit interconnections; BLOk; Black Diamond; Cu; backend integration; copper damascene technology; copper interconnect technology; integrated circuit manufacturing; logic device; low-k interlayer dielectric film; Copper; Dielectric films; Dielectric materials; Energy consumption; Integrated circuit manufacture; Logic devices; Manufacturing processes; Power generation; Semiconductor device manufacture; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop
Print_ISBN :
0-7803-7158-5
Type :
conf
DOI :
10.1109/ASMC.2002.1001633
Filename :
1001633
Link To Document :
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