A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization

Author

Ghannouchi, Fadhel M. ; Bosisio, Renato G.

Author_Institution

Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada

fYear

1991

Firstpage

180

Lastpage

182

Abstract

A description is given of a six-port reflectometer with a variable test port impedance. The six-port junction was specially designed to allow the variation of the test port impedance over almost all of the Smith chart. Such a reflectometer is found suitable for active nonlinear microwave oscillator characterization such as microwave source pull/load pull oscillator measurements, and device line measurements of negative resistance one port terminal devices

Keywords

electric impedance measurement; microwave oscillators; microwave reflectometry; reflectometers; solid-state microwave circuits; solid-state microwave devices; Smith chart; active nonlinear microwave oscillator; microwave source pull/load pull oscillator; negative resistance one port terminal devices; nonlinear microwave device; six-port junction; six-port reflectometer; variable test port impedance; Electrical resistance measurement; Impedance measurement; Microwave devices; Microwave measurements; Microwave oscillators; Power measurement; Reflection; Scattering parameters; System testing; Tuners;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE

Conference_Location

Atlanta, GA

Print_ISBN

0-87942-579-2

Type

conf

DOI

10.1109/IMTC.1991.161571

Filename

161571