Title :
A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization
Author :
Ghannouchi, Fadhel M. ; Bosisio, Renato G.
Author_Institution :
Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada
Abstract :
A description is given of a six-port reflectometer with a variable test port impedance. The six-port junction was specially designed to allow the variation of the test port impedance over almost all of the Smith chart. Such a reflectometer is found suitable for active nonlinear microwave oscillator characterization such as microwave source pull/load pull oscillator measurements, and device line measurements of negative resistance one port terminal devices
Keywords :
electric impedance measurement; microwave oscillators; microwave reflectometry; reflectometers; solid-state microwave circuits; solid-state microwave devices; Smith chart; active nonlinear microwave oscillator; microwave source pull/load pull oscillator; negative resistance one port terminal devices; nonlinear microwave device; six-port junction; six-port reflectometer; variable test port impedance; Electrical resistance measurement; Impedance measurement; Microwave devices; Microwave measurements; Microwave oscillators; Power measurement; Reflection; Scattering parameters; System testing; Tuners;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161571
