• DocumentCode
    1581806
  • Title

    An quality metric for 3D rendered image based on stereo saliency and structural similarity

  • Author

    Dongdong Zhang ; Jiahe Huang ; Di Zang ; Dian Liu ; Yanyu Chen

  • Author_Institution
    Comput. Sci. Dept., Tongji Univ., Shanghai, China
  • fYear
    2013
  • Firstpage
    170
  • Lastpage
    174
  • Abstract
    In this paper, we propose an objective quality metric based on stereo saliency and structural similarity for the rendered image which is produced by depth image based rendering (DIBR) method. The rendered image and color image are not from the same view, which will lead to disparity between these two images, so the traditional quality metric cannot work. To deal with this problem, we use Scale-invariant feature transform (SIFT) to extract the matching characteristic points. The Structural Similarity (SSIM) is further used to assess compression and geometric distortions around these characteristic points. Additionally, we take 3D saliency map as a description of visual attention effect into account, which is used to determine the weights of the SSIM indices. Experimental results show that the proposed metric achieves a high correlation with subjective perception.
  • Keywords
    data compression; feature extraction; geometry; image coding; image colour analysis; image matching; rendering (computer graphics); stereo image processing; transforms; 3D rendered image; 3D saliency map; DIBR method; SIFT; SSIM indices; color image; compression; depth image based rendering; geometric distortions; image disparity; matching characteristic points; objective quality metric; scale-invariant feature transform; stereo saliency; structural similarity; visual attention effect; Color; Image coding; Image color analysis; Image edge detection; Measurement; Three-dimensional displays; Visualization; 3D saliency; Objective quality metric; SIFT; SSIM; rendered image;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Global High Tech Congress on Electronics (GHTCE), 2013 IEEE
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/GHTCE.2013.6767266
  • Filename
    6767266