Title :
Assessing base level of service for electronics collection and recycling programs: Seattle-Tacoma case study
Author :
Caudill, Reggie ; Jackson, Sego ; Rifer, Wayne ; Marella, Frank ; Cole, Steven ; Willmott, Abby
Author_Institution :
New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
The National Electronics Product Stewardship Initiative (NEPSI) was established by the US EPA to examine issues associated with electronics recycling, engage in discussions to build consensus among all stakeholder groups, and recommend a strategy for developing a national electronics recycling program. One of the tasks of the NEPSI Infrastructure Subgroup was to study programs of other nations and the various pilot projects and state initiatives here in the US and develop guidelines for a base level of service for collection and recycling which would apply across the country. Fundamental to the concept of base level of service is the need to balance convenience with cost-effectiveness and operational efficiency. To better understand the concept and underlying principles of base service, this project was undertaken to construct and evaluate realistic collection and recycling program scenarios for the Seattle-Tacoma urban area. The results of this study provide a better understanding of the collection, transportation and recycling infrastructure needed for a defined collection service area with associated operational requirements and costs.
Keywords :
costing; recycling; National Electronics Product Stewardship Initiative; Seattle-Tacoma; cost models; cost-effectiveness; electronics collection; electronics collection infrastructure; electronics recycling programs; material flow simulation; national electronics recycling program; operational efficiency; urban area; Analytical models; Computational modeling; Computer aided software engineering; Computer simulation; Costs; Guidelines; Recycling; TV; Transportation; Urban areas;
Conference_Titel :
Electronics and the Environment, 2003. IEEE International Symposium on
Print_ISBN :
0-7803-7743-5
DOI :
10.1109/ISEE.2003.1208095