Title :
20th IEEE Instrumentation and Measurement Technology Conference IMTC ´03
Abstract :
Presents the front cover of the proceedings.
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Conference_Location :
Vail, Colorado, USA
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208109
