Title :
Mutation analysis for Lustre programs: Fault model description and validation
Author :
Du Bousquet, Lydie ; Delaunay, Michel
Author_Institution :
LSR-IMAG, St. Martin d´´Heres
Abstract :
Mutation analysis is usually used to provide an indication of the fault detection ability of a test set. It is mainly used for unit testing evaluation, but has also been extended for integration testing evaluation. This paper describes adaptation of mutation analysis to the Lustre programming language, including both unit and integration testing. This paper focuses on the fault model, which has been extended since our previous works. Validation of the fault model is presented.
Keywords :
fault tolerant computing; high level languages; Lustre programming language; fault model description; fault model validation; mutation analysis; Automatic testing; Computer languages; Design methodology; Fault detection; Genetic mutations; Optical character recognition software; Software testing;
Conference_Titel :
Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION, 2007. TAICPART-MUTATION 2007
Conference_Location :
Windsor
Print_ISBN :
978-0-7695-2984-4
DOI :
10.1109/TAIC.PART.2007.27