Title :
Coefficient-based test of parametric faults in analog circuits
Author :
Guo, Zhen ; Savir, Jacob
Author_Institution :
New Jersey Institute Of Technology
Keywords :
Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Equations; Fault detection; Jacobian matrices; Linear systems; System identification; Transfer functions;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208124
