• DocumentCode
    1582585
  • Title

    Coefficient-based test of parametric faults in analog circuits

  • Author

    Guo, Zhen ; Savir, Jacob

  • Author_Institution
    New Jersey Institute Of Technology
  • Volume
    1
  • fYear
    2003
  • Firstpage
    71
  • Lastpage
    75
  • Keywords
    Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Equations; Fault detection; Jacobian matrices; Linear systems; System identification; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208124
  • Filename
    1208124
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1582585