Title :
IEEE TC-10: what´s it all about?
Author :
Linnenbrink, Thomas E. ; Boyer, William B. ; Paulter, Nicholas G., Jr. ; Tilden, Steven J.
Author_Institution :
Q-DOT, Inc.
Keywords :
Analog-digital conversion; Character generation; Circuit testing; Instruments; Laboratories; Manufacturing; Measurement standards; NIST; Pulse measurements; Standards development;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208130
