Title :
Testing and diagnostics of SIMD arrays
Author_Institution :
Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland
Abstract :
An original approach to the testing and diagnostics of SIMD (single instruction, multiple data) systems is presented. Test algorithms for typical data processing elements of SIMDs are described and the problem of their optimal software implementation in the SIMD environment is discussed (concurrent testing, error coverage and time overhead). Fault localization procedures (diagnostics) are combined with testing processes.
Keywords :
computer testing; fault location; systolic arrays; SIMD array diagnostics; SIMD array testing; concurrent testing; data processing elements; error coverage; fault localization procedures; optimal software implementation; time overhead; Circuit faults; Circuit testing; Controllability; Data processing; Observability; Performance evaluation; Read-write memory; Registers; Software testing; System testing;
Conference_Titel :
EUROMICRO 97. New Frontiers of Information Technology., Proceedings of the 23rd EUROMICRO Conference
Conference_Location :
Budapest, Hungary
Print_ISBN :
0-8186-8129-2
DOI :
10.1109/EURMIC.1997.617226
