DocumentCode
1583402
Title
Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)
Author
Nakane, Hiroshi ; Watanabe, Tuneo ; Nagata, Chohjyu ; Fujiwara, Satoshi ; Yoshizawa, Shuji
Author_Institution
Sci. Univ. of Tokyo, Japan
fYear
1991
Firstpage
213
Lastpage
216
Abstract
The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10-12 Ω-m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples
Keywords
copper; electrical conductivity measurement; electrical conductivity of solids; solenoids; 100 Hz; Cu core; DC four-probe method; circular multilayer solenoid coil; cylindrical Cu core; difference; dirt; frequency dependence; impedance; oxide coating; residual resistivity ratio; skin depth; temperature dependence of resistivity; Coils; Conductivity; Copper; Frequency dependence; Frequency measurement; Impedance measurement; Nonhomogeneous media; Solenoids; Temperature dependence; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location
Atlanta, GA
Print_ISBN
0-87942-579-2
Type
conf
DOI
10.1109/IMTC.1991.161578
Filename
161578
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