DocumentCode :
1583402
Title :
Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)
Author :
Nakane, Hiroshi ; Watanabe, Tuneo ; Nagata, Chohjyu ; Fujiwara, Satoshi ; Yoshizawa, Shuji
Author_Institution :
Sci. Univ. of Tokyo, Japan
fYear :
1991
Firstpage :
213
Lastpage :
216
Abstract :
The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10-12 Ω-m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples
Keywords :
copper; electrical conductivity measurement; electrical conductivity of solids; solenoids; 100 Hz; Cu core; DC four-probe method; circular multilayer solenoid coil; cylindrical Cu core; difference; dirt; frequency dependence; impedance; oxide coating; residual resistivity ratio; skin depth; temperature dependence of resistivity; Coils; Conductivity; Copper; Frequency dependence; Frequency measurement; Impedance measurement; Nonhomogeneous media; Solenoids; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
Type :
conf
DOI :
10.1109/IMTC.1991.161578
Filename :
161578
Link To Document :
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