• DocumentCode
    1583402
  • Title

    Measuring the temperature dependence of resistivity of high purity copper using a solenoid coil (SRPM method)

  • Author

    Nakane, Hiroshi ; Watanabe, Tuneo ; Nagata, Chohjyu ; Fujiwara, Satoshi ; Yoshizawa, Shuji

  • Author_Institution
    Sci. Univ. of Tokyo, Japan
  • fYear
    1991
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    The resistivity of high-purity copper was measured by a method that estimates resistivity by using the difference in the impedance of a circular multilayer solenoid coil with a cylindrical copper core and an identical coil without a copper core (SRPM method). It was confirmed that an exact measurement of the resistivity of 10-12 Ω-m can be made. The residual resistivity ratio (RRR) of high-purity copper measured at 100 Hz correlates well with the values measured by the DC four-probe method. The existence of frequency dependence was discovered at very low resistivity for high-purity copper. As the measuring frequency is raised, the skin depth seems to affect the surface resistivity due to the oxide coating and dirt on the surface of the samples
  • Keywords
    copper; electrical conductivity measurement; electrical conductivity of solids; solenoids; 100 Hz; Cu core; DC four-probe method; circular multilayer solenoid coil; cylindrical Cu core; difference; dirt; frequency dependence; impedance; oxide coating; residual resistivity ratio; skin depth; temperature dependence of resistivity; Coils; Conductivity; Copper; Frequency dependence; Frequency measurement; Impedance measurement; Nonhomogeneous media; Solenoids; Temperature dependence; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-87942-579-2
  • Type

    conf

  • DOI
    10.1109/IMTC.1991.161578
  • Filename
    161578