DocumentCode

1583551

Title

Sequential bayesian bit error rate measurement

Author

Barford, Lee

Author_Institution

Agilent Laboratories

Volume

1

fYear

2003

Firstpage

277

Lastpage

282

Keywords

Bayesian methods; Bit error rate; Clocks; Degradation; Digital communication; Distributed computing; Extrapolation; Laboratories; Testing; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE

ISSN

1091-5281

Print_ISBN

0-7803-7705-2

Type

conf

DOI

10.1109/IMTC.2003.1208166

Filename

1208166