Title :
Sequential bayesian bit error rate measurement
Author_Institution :
Agilent Laboratories
Keywords :
Bayesian methods; Bit error rate; Clocks; Degradation; Digital communication; Distributed computing; Extrapolation; Laboratories; Testing; Time measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208166
