Title :
Evaluating the repair of system-on-chip (soc) using connectivity
Author :
Choi, M. ; Park, N. ; Piuri, V. ; Kim, Y.B. ; Lombardi, F.
Author_Institution :
University of Missouri-Rolla
Keywords :
Delay systems; Instruments; Job shop scheduling; Logic programming; Manufacturing; Reconfigurable logic; Redundancy; System performance; System-on-a-chip; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208172
