Title :
Soft-test/repair of ccd-based digital x-ray instrumentation
Author :
Jin, B. ; Park, N. ; George, K.M. ; Choi, M. ; Yeary, M. ; Kim, Y.B.
Author_Institution :
Oklahoma State University
Keywords :
Biomedical imaging; Calibration; Charge coupled devices; Charge-coupled image sensors; Costs; Image converters; Instruments; Pixel; System testing; X-ray imaging;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208173
