Title :
Optical limitations to cell size reduction in IT-CCD image sensors
Author :
Satoh, T. ; Mutoh, N. ; Furumiya, M. ; Murakami, I. ; Suwazono, S. ; Ogawa, C. ; Hatano, K. ; Utsumi, H. ; Kawai, S. ; Arai, K. ; Morimoto, M. ; Orihara, K. ; Tamura, T. ; Teranishi, N. ; Hokari, Y.
Author_Institution :
Microelectron. Res. Labs., NEC Corp., Sagamihara, Japan
Abstract :
We have determined the practical limits of cell size reduction in interline-transfer CCD image sensors, limits resulting from diffraction occurring at the aperture above the photodiode. We have found that image cell size cannot be reduced to a level for which aperture width would fall below about 0.2 μm. We have also found, however, that image cells with greater than 0.2 μm aperture size are sensitive over the entire wavelength range of visible light, and that sensitivity can be increased by thinning the photoshield film
Keywords :
CCD image sensors; photodiodes; 0.2 micron; IT-CCD image sensors; aperture width; cell size reduction; image cell size; interline-transfer devices; photodiode; photoshield film; Apertures; Charge coupled devices; Charge-coupled image sensors; Diffraction; Digital cameras; HDTV; Image sensors; Optical films; Optical sensors; Photodiodes;
Conference_Titel :
Electron Devices Meeting, 1995. IEDM '95., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2700-4
DOI :
10.1109/IEDM.1995.497204