• DocumentCode
    1583794
  • Title

    Optical limitations to cell size reduction in IT-CCD image sensors

  • Author

    Satoh, T. ; Mutoh, N. ; Furumiya, M. ; Murakami, I. ; Suwazono, S. ; Ogawa, C. ; Hatano, K. ; Utsumi, H. ; Kawai, S. ; Arai, K. ; Morimoto, M. ; Orihara, K. ; Tamura, T. ; Teranishi, N. ; Hokari, Y.

  • Author_Institution
    Microelectron. Res. Labs., NEC Corp., Sagamihara, Japan
  • fYear
    1995
  • Firstpage
    159
  • Lastpage
    162
  • Abstract
    We have determined the practical limits of cell size reduction in interline-transfer CCD image sensors, limits resulting from diffraction occurring at the aperture above the photodiode. We have found that image cell size cannot be reduced to a level for which aperture width would fall below about 0.2 μm. We have also found, however, that image cells with greater than 0.2 μm aperture size are sensitive over the entire wavelength range of visible light, and that sensitivity can be increased by thinning the photoshield film
  • Keywords
    CCD image sensors; photodiodes; 0.2 micron; IT-CCD image sensors; aperture width; cell size reduction; image cell size; interline-transfer devices; photodiode; photoshield film; Apertures; Charge coupled devices; Charge-coupled image sensors; Diffraction; Digital cameras; HDTV; Image sensors; Optical films; Optical sensors; Photodiodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1995. IEDM '95., International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2700-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1995.497204
  • Filename
    497204