DocumentCode
1583794
Title
Optical limitations to cell size reduction in IT-CCD image sensors
Author
Satoh, T. ; Mutoh, N. ; Furumiya, M. ; Murakami, I. ; Suwazono, S. ; Ogawa, C. ; Hatano, K. ; Utsumi, H. ; Kawai, S. ; Arai, K. ; Morimoto, M. ; Orihara, K. ; Tamura, T. ; Teranishi, N. ; Hokari, Y.
Author_Institution
Microelectron. Res. Labs., NEC Corp., Sagamihara, Japan
fYear
1995
Firstpage
159
Lastpage
162
Abstract
We have determined the practical limits of cell size reduction in interline-transfer CCD image sensors, limits resulting from diffraction occurring at the aperture above the photodiode. We have found that image cell size cannot be reduced to a level for which aperture width would fall below about 0.2 μm. We have also found, however, that image cells with greater than 0.2 μm aperture size are sensitive over the entire wavelength range of visible light, and that sensitivity can be increased by thinning the photoshield film
Keywords
CCD image sensors; photodiodes; 0.2 micron; IT-CCD image sensors; aperture width; cell size reduction; image cell size; interline-transfer devices; photodiode; photoshield film; Apertures; Charge coupled devices; Charge-coupled image sensors; Diffraction; Digital cameras; HDTV; Image sensors; Optical films; Optical sensors; Photodiodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1995. IEDM '95., International
Conference_Location
Washington, DC
ISSN
0163-1918
Print_ISBN
0-7803-2700-4
Type
conf
DOI
10.1109/IEDM.1995.497204
Filename
497204
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