Title :
Experimental characterization of operational amplifiers: a system identification approach
Author :
Pintelon, R. ; Vandersteen, G. ; Rolain, Y.
Author_Institution :
Vrije Universiteit Brussel
Keywords :
Distortion measurement; Frequency measurement; Gain measurement; Measurement uncertainty; Noise measurement; Nonlinear distortion; Operational amplifiers; Power measurement; Power supplies; System identification;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208181
