Title :
Test generation for sequential networks affected by reconvergent fanout: a solution based on a 9-valued algebraic circuit model
Author :
Macii, Enrico ; Meo, Angelo R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Abstract :
Test generation for sequential networks affected by reconvergent fanout implies the simultaneous management of the good circuit and the faulty circuit. A theoretical approach to the solution of this problem, based on the definition of a 9 valued algebraic circuit model, is proposed. Results obtained on the set of ISCAS ´89 circuits show the effectiveness of the technique
Keywords :
logic testing; many-valued logics; sequential circuits; 9-valued algebraic circuit model; ISCAS ´89 circuits; reconvergent fanout; sequential networks; test generation; Algebra; Automatic test pattern generation; Circuit faults; Circuit testing; Computer network management; Computer networks; Design methodology; Pattern recognition; Sequential analysis; Sequential circuits;
Conference_Titel :
Signals, Systems and Computers, 1992. 1992 Conference Record of The Twenty-Sixth Asilomar Conference on
Conference_Location :
Pacific Grove, CA
Print_ISBN :
0-8186-3160-0
DOI :
10.1109/ACSSC.1992.269074
