• DocumentCode
    1584014
  • Title

    A new linearity measurement algorithm for sub-micron microwave cmos

  • Author

    Choi, Woo Young ; Choi, Byung Yong ; Woo, Dong-Soo ; Lee, Jong Duk ; Park, Byung-Gook

  • Author_Institution
    Seoul National University
  • Volume
    1
  • fYear
    2003
  • Firstpage
    374
  • Lastpage
    376
  • Keywords
    Capacitance measurement; Character generation; Data mining; Electric variables measurement; Linearity; Loss measurement; Microwave devices; Microwave measurements; Noise measurement; Semiconductor device noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208183
  • Filename
    1208183
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1584014