DocumentCode :
1584361
Title :
S&D salicidation for advanced CMOS technology: Ge, SiGe, Si:C, and sSibased devices
Author :
Carron, V.
fYear :
2008
Abstract :
▪ Strained and Ge-based materials have great interests for CMOS technology enhancement ▪ However, their introduction as channel and/or S&D materials has a strong impact on the Salicide process which needs adaptations in order to keep the expected benefit induced by these new materials ▪ Indeed, new issues related to the silicidation (germanidation) of these advanced materials have emerged and most of them have been solved (exemple : Ge lateral diffusion) ▪ In addition to strained and Ge-based materials, the choice of the silicide/germanide contact material in itself, as well as the associated salicide process, are key areas for further performance enhancement (interface engineering, dual silicide approach…)
Keywords :
CMOS technology; Capacitive sensors; Conferences; DSL; Degradation; Germanium silicon alloys; Research and development; Silicon germanium; Stress; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Thermal Processing of Semiconductors, 2008. RTP 2008. 16th IEEE International Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
978-1-4244-1950-0
Electronic_ISBN :
978-1-4244-1951-7
Type :
conf
DOI :
10.1109/RTP.2008.4690533
Filename :
4690533
Link To Document :
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