DocumentCode :
1584565
Title :
Micromechanical electrostatic voltmeter
Author :
Hsu, C.H. ; Muller, R.S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
1991
Firstpage :
659
Lastpage :
662
Abstract :
The prototype for a microminiature, noncontacting electrostatic voltmeter (ESV) is discussed. The ESV works on the principle of intermittent shuttering and exposing a sensing electrode to an electric field between a remote electrode at a different potential from the sensing electrode. The resultant time-varying field at the electrode produces an electrical signal which can be used to monitor the remote voltage. The prototype ESVs hat have been made and tested have electrostatic-comb drives and shutters with areas ranging from 0.022 to 0.067 mm/sup 2/ that are suspended roughly 2 mu m above the surface of the silicon substrate. Initial tests on ESVs showed them to respond to voltages above 20 V for electrodes spaced 0.2 mm away. Sensitivity is expected to be greatly improved by redesigns that are already being investigated.<>
Keywords :
electrostatic devices; micromechanical devices; silicon; voltmeters; 0.2 mm; 20 V; IC; Si; electrostatic-comb drives; intermittent shuttering; micromechanical microminiature voltmeter; noncontacting electrostatic voltmeter; polysilicon microshutter; remote electrode; remote voltage; sensing electrode; time-varying field; Electrodes; Electrostatics; Micromechanical devices; Prototypes; Remote monitoring; Rough surfaces; Surface roughness; Testing; Voltage; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-585-7
Type :
conf
DOI :
10.1109/SENSOR.1991.148966
Filename :
148966
Link To Document :
بازگشت