Title :
Geometrical characterization of 3D defects by artificial vision
Author :
Dumont, C. ; Fauvet, E. ; Truchetet, F. ; Jender, H.
Author_Institution :
Lab. GERE, IUT Le Creusot, France
Abstract :
In this article, the authors propose a real-time method for the geometrical characterization of defects located on the surface of a 3D object. The algorithm is built from information contained on a 3D grid of the object to be controlled. The efficiency of the characterization method is judging experimentally
Keywords :
computer vision; computerised instrumentation; spatial variables measurement; surface topography; 3D defects; 3D grid information; 3D object surface; artificial vision; efficiency; geometrical characterization; real-time method; Cameras; Charge coupled devices; Equations; Geometrical optics; Image segmentation; Machine vision; Pixel; Quality control; Shape; Transmission line matrix methods;
Conference_Titel :
Industrial Electronics, 1995. ISIE '95., Proceedings of the IEEE International Symposium on
Conference_Location :
Athens
Print_ISBN :
0-7803-7369-3
DOI :
10.1109/ISIE.1995.497241
