• DocumentCode
    1584909
  • Title

    Low temperature microwave annealing of S/D

  • Author

    Lojek, Bo

  • Author_Institution
    Atmel Corporation, 1150 E. Cheyenne Mtn. Blvd., Colorado Springs, 80906, USA
  • fYear
    2008
  • Firstpage
    201
  • Lastpage
    209
  • Abstract
    Microwave annealing of ion-implanted layers in semiconductors is an emerging application of thermal processing of semiconductors, with low processing temperature eliminating unwanted diffusion as the main potential advantage. In this work, requirements and limitations of the microwave processing chamber are discussed first, and secondly, for the first time, results from a processed manufacturing lot using microwave annealing are discussed. The achieved results show that is feasible to achieve the same level of activation of implanted layers as in conventional high temperature RTP processing using the microwave at temperatures below 400 °C, and equivalent processing time.
  • Keywords
    Annealing; Conductivity; Electromagnetic heating; Manufacturing processes; Microwave devices; Reproducibility of results; Semiconductor device manufacture; Springs; Temperature control; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Thermal Processing of Semiconductors, 2008. RTP 2008. 16th IEEE International Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    978-1-4244-1950-0
  • Electronic_ISBN
    978-1-4244-1951-7
  • Type

    conf

  • DOI
    10.1109/RTP.2008.4690556
  • Filename
    4690556