DocumentCode
1584909
Title
Low temperature microwave annealing of S/D
Author
Lojek, Bo
Author_Institution
Atmel Corporation, 1150 E. Cheyenne Mtn. Blvd., Colorado Springs, 80906, USA
fYear
2008
Firstpage
201
Lastpage
209
Abstract
Microwave annealing of ion-implanted layers in semiconductors is an emerging application of thermal processing of semiconductors, with low processing temperature eliminating unwanted diffusion as the main potential advantage. In this work, requirements and limitations of the microwave processing chamber are discussed first, and secondly, for the first time, results from a processed manufacturing lot using microwave annealing are discussed. The achieved results show that is feasible to achieve the same level of activation of implanted layers as in conventional high temperature RTP processing using the microwave at temperatures below 400 °C, and equivalent processing time.
Keywords
Annealing; Conductivity; Electromagnetic heating; Manufacturing processes; Microwave devices; Reproducibility of results; Semiconductor device manufacture; Springs; Temperature control; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Thermal Processing of Semiconductors, 2008. RTP 2008. 16th IEEE International Conference on
Conference_Location
Las Vegas, NV, USA
Print_ISBN
978-1-4244-1950-0
Electronic_ISBN
978-1-4244-1951-7
Type
conf
DOI
10.1109/RTP.2008.4690556
Filename
4690556
Link To Document