Title :
The breakdown strength of two-layer dielectrics
Author :
Lebedev, S.M. ; Gefle, O.S. ; Pokholkov, Yu.P. ; Chichikin, V.I.
Author_Institution :
Tomsk Polytech. Inst., Russia
fDate :
6/21/1905 12:00:00 AM
Abstract :
In paper, experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. They suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers
Keywords :
insulation testing; boundary position; breakdown strength; conductivity; dissipation factor; permittivity; relaxation polarization; two-layer dielectrics;
Conference_Titel :
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location :
London
Print_ISBN :
0-85296-719-5
DOI :
10.1049/cp:19990853