DocumentCode
1584987
Title
The breakdown strength of two-layer dielectrics
Author
Lebedev, S.M. ; Gefle, O.S. ; Pokholkov, Yu.P. ; Chichikin, V.I.
Author_Institution
Tomsk Polytech. Inst., Russia
Volume
4
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
304
Abstract
In paper, experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. They suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers
Keywords
insulation testing; boundary position; breakdown strength; conductivity; dissipation factor; permittivity; relaxation polarization; two-layer dielectrics;
fLanguage
English
Publisher
iet
Conference_Titel
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location
London
ISSN
0537-9989
Print_ISBN
0-85296-719-5
Type
conf
DOI
10.1049/cp:19990853
Filename
821281
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