• DocumentCode
    1584987
  • Title

    The breakdown strength of two-layer dielectrics

  • Author

    Lebedev, S.M. ; Gefle, O.S. ; Pokholkov, Yu.P. ; Chichikin, V.I.

  • Author_Institution
    Tomsk Polytech. Inst., Russia
  • Volume
    4
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    304
  • Abstract
    In paper, experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. They suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers
  • Keywords
    insulation testing; boundary position; breakdown strength; conductivity; dissipation factor; permittivity; relaxation polarization; two-layer dielectrics;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
  • Conference_Location
    London
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-719-5
  • Type

    conf

  • DOI
    10.1049/cp:19990853
  • Filename
    821281