Title :
Introduction to panel discussion Probabilistic & statistical design - the wave of the future
Author_Institution :
Intel Corporation
Keywords :
Error analysis; Fluctuations; Integrated circuit reliability; Lithography; Power grids; Power system dynamics; Power system reliability; Stress; System performance; Very large scale integration;
Conference_Titel :
Very Large Scale Integration, 2006 IFIP International Conference on
Conference_Location :
Nice
Print_ISBN :
3-901882-19-7
DOI :
10.1109/VLSISOC.2006.313283
