DocumentCode :
1585173
Title :
Extracting ERP by combination of Subspace Method and Lift Wavelet Transform
Author :
Xiong, Xinbing ; Chen, Yaguang
Author_Institution :
Sch. of Electr. & Informatics Eng., South-center Univ. for Nat., Wuhan
fYear :
2006
Firstpage :
5938
Lastpage :
5941
Abstract :
Event related potentials (ERP) recorded from the scalp include various noises. The main source of the noise is the spontaneous brain activity and it is called the background electroencephalography (EEG). Because EEG is highly colored, we wouldn´t effectively remove EEG noise by wavelet transform. This paper proposed a new approach that combined the subspace method and lift wavelet transform in order to reduce the number of trials required for the extraction of the brain event related potentials. First, the signal subspace is estimated by applying the singular value decomposition (SVD). Orthonormal projecting the raw data onto the estimated signal subspace can obtain a pre-denoised signal and it whitened the colored noise. Next, the ERPs are extracted by lift wavelet construction of the enhanced version. Simulation results show that the combination of both two methods provides much better capability than each of them separately
Keywords :
bioelectric potentials; electroencephalography; medical signal processing; signal denoising; singular value decomposition; wavelet transforms; EEG; ERP extraction; background electroencephalography; event related potentials; lift wavelet transform; predenoised signal; singular value decomposition; spontaneous brain activity; subspace method; Brain; Colored noise; Data mining; Discrete wavelet transforms; Electroencephalography; Enterprise resource planning; Noise reduction; Signal to noise ratio; Singular value decomposition; Wavelet transforms; Event Related Potentials; Lift Wavelet Transform; Singular Value Decomposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8741-4
Type :
conf
DOI :
10.1109/IEMBS.2005.1615843
Filename :
1615843
Link To Document :
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