Title :
Modelling of partially-segmented d/a converters
Author :
Vargha, Balks ; Schoukens, Johan ; Rolain, Yves
Author_Institution :
Budapest University of Technology and Economics
Keywords :
Circuit testing; Decoding; Electronic mail; Gain measurement; Information systems; Linearity; Manufacturing; Resistors; Voltage; World Wide Web;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208233
