Title :
On-chip rise time measurement
Author :
Lin, S.L. ; Mourad, Samiha
Author_Institution :
Santa Clara University
Keywords :
Built-in self-test; Cables; Circuit testing; Electronic equipment testing; Instruments; Modems; Performance evaluation; Pins; Semiconductor device measurement; Time measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208245
