DocumentCode
1585614
Title
On-chip rise time measurement
Author
Lin, S.L. ; Mourad, Samiha
Author_Institution
Santa Clara University
Volume
1
fYear
2003
Firstpage
688
Lastpage
692
Keywords
Built-in self-test; Cables; Circuit testing; Electronic equipment testing; Instruments; Modems; Performance evaluation; Pins; Semiconductor device measurement; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1208245
Filename
1208245
Link To Document