Title :
A parallel built-in self-diagnostic method for non-traditional faults of embedded memory arrays
Author :
Arora, V. ; Jone, W.B. ; Huang, D.C. ; Das, S.R.
Author_Institution :
University of Cincinnati
Keywords :
Bidirectional control; Built-in self-test; Circuit faults; Fault diagnosis; Hardware design languages; Information technology; Routing; Size control; Testing; Wires;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208247
