• DocumentCode
    1585690
  • Title

    A parallel built-in self-diagnostic method for non-traditional faults of embedded memory arrays

  • Author

    Arora, V. ; Jone, W.B. ; Huang, D.C. ; Das, S.R.

  • Author_Institution
    University of Cincinnati
  • Volume
    1
  • fYear
    2003
  • Firstpage
    700
  • Lastpage
    705
  • Keywords
    Bidirectional control; Built-in self-test; Circuit faults; Fault diagnosis; Hardware design languages; Information technology; Routing; Size control; Testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208247
  • Filename
    1208247
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1585690