Title :
Analog CMOS integrated circuits for high-temperature operation with leakage current compensation
Author :
Mizuno, Kentaro ; Ohta, Norikazu ; Kitagawa, Fumitaka ; Nagase, Hiroshi
Author_Institution :
Toyota Central Res. & Dev. Labs. Inc., Aichi, Japan
Abstract :
To facilitate high-temperature operation of CMOS analog integrated circuits, we proposed new compensation circuits which compensated for PN-junction leakage current more precisely than conventional compensation circuits. As the result of applying these circuits to a voltage reference circuit, the operating temperature region was extended 20-40°C
Keywords :
CMOS analogue integrated circuits; compensation; high-temperature electronics; integrated circuit design; leakage currents; reference circuits; 20 to 40 C; PN-junction leakage current; analog CMOS integrated circuits; high-temperature operation; leakage current compensation; operating temperature region; voltage reference circuit; Analog integrated circuits; CMOS analog integrated circuits; CMOS integrated circuits; Diodes; Leakage current; MOSFET circuits; Research and development; Temperature dependence; Temperature distribution; Threshold voltage;
Conference_Titel :
High Temperature Electronics Conference, 1998. HITEC. 1998 Fourth International
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-4540-1
DOI :
10.1109/HITEC.1998.676758
