Title :
Dynamic error correction of a digitizer for time domain metrology
Author :
Bergman, David I.
Author_Institution :
National Institute of Standards and Technology
Keywords :
Application specific integrated circuits; Error correction; Frequency; Harmonic distortion; Integrated circuit measurements; Metrology; NIST; Phase distortion; Probes; Sampling methods;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208256
