Title :
Using redundancy to break the link between accuracy and speed in an adc
Author :
Flynn, Michael P. ; Bogue, Ivan
Author_Institution :
University of Michigan
Keywords :
Analog circuits; Analog-digital conversion; Calibration; Capacitors; Digital control; MOSFETs; Preamplifiers; Redundancy; Resistors; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208275
