Title :
Development of open architecture test systems
Author :
Diyin, Tang ; Jinsong Yu ; Xiongzi, Chen ; Honglun, Wang
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
Abstract :
Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.
Keywords :
automatic test equipment; design for testability; ATE software technologies; next generation test system; open architecture test systems; parallel development; test software; Computer architecture; Educational institutions; Hardware; Instruments; Libraries; Software; Testing; ATE; ATE software technologies; application-oriented; open architecture;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037763