Title :
Simultaneous Placement and Buffer Planning for Reduction of Power Consumption in Interconnects and Repeaters
Author :
Murgan, T. ; Mitea, O. ; Pandey, S. ; Bacinschi, P.B. ; Glesner, M.
Author_Institution :
Inst. of Microelectron. Syst., Darmstadt Univ. of Technol.
Abstract :
Due to shrinking process geometries and an increasing number of chip components in very deep sub-micron technologies, interconnects emerged as a main limiting factor for performance, die area, and power consumption. Buffer allocation, interconnect congestion, power dissipation in buffered interconnects pose tremendous difficulties on the design process. It is therefore of paramount importance to address interconnect and buffer planning at early stages in the design flow, especially from the perspective of power consumption and thermal management. The goal of this work is to indicate the remarkable opportunities in reducing power consumption in buffered interconnects during placement, and to extend a classical placement algorithm to include power-optimized interconnect and buffer planning. The authors merge a placement algorithm based on simulated annealing with A-tree construction, van Ginneken´s buffer insertion algorithm, and accurate moment-based delay computation. The authors show that dramatic improvements can be achieved in terms of total interconnect structure capacitance and total area of required buffers
Keywords :
buffer circuits; integrated circuit design; integrated circuit interconnections; simulated annealing; thermal management (packaging); trees (mathematics); A-tree construction; buffer allocation; buffer planning; integrated circuit interconnections; interconnect congestion; simulated annealing; thermal management; van Ginneken buffer insertion; Computational modeling; Delay; Energy consumption; Energy management; Geometry; Power dissipation; Process design; Repeaters; Simulated annealing; Thermal management;
Conference_Titel :
Very Large Scale Integration, 2006 IFIP International Conference on
Conference_Location :
Nice
Print_ISBN :
3-901882-19-7
DOI :
10.1109/VLSISOC.2006.313251