• DocumentCode
    1586640
  • Title

    Chemical metallization of ceramic substrates-an alternative to thick and thin film technology

  • Author

    Feil, Michael

  • Author_Institution
    Fraunhofer-Inst. for Solid State Technol., Munich, West Germany
  • fYear
    1988
  • Firstpage
    106
  • Lastpage
    111
  • Abstract
    The material properties of chemically deposited copper and patterning techniques are described. This is followed by a depiction of the RF capability and important mechanical properties such as adhesive strength, solderability, and bondability. Starting points for the integration of resistors and multilayer metallizations are suggested. An example for practical application is given.<>
  • Keywords
    ceramics; integrated circuit technology; metallisation; RF capability; adhesive strength; bondability; ceramic substrates; metallization; multilayer metallizations; patterning techniques; resistors; solderability; Adhesive strength; Bonding; Ceramics; Chemicals; Copper; Material properties; Mechanical factors; Metallization; Radio frequency; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1988, Design-to-Manufacturing Transfer Cycle. Fifth IEEE/CHMT International
  • Conference_Location
    Lake Buena Vista, FL, USA
  • Type

    conf

  • DOI
    10.1109/EMTS.1988.16159
  • Filename
    16159